The UltraScan VIS easily measures both reflected and transmitted color as well as transmission haze and meets CIE, ASTM and USP guidelines for accurate color measurement. UltraScan VIS uses diffuse/8° geometry with automated specular component inclusion/exclusion. For transmission measurement, the use of a robust CIE-conforming sphere instrument (TTRAN Total Transmission mode) effectively negates the effects of minor scattering typically found in transparent samples.
Because of its exceptional inter-instrument agreement and long-term stability, you can be confident that differences between measurements are due to product color changes, not instrument variability. Materials on the borderline of accepted tolerances will not be unnecessarily rejected.
Explore all the additional features and benefits below.
Measurement Principle: Dual-beam benchtop spectrophotometer
Geometry: Diffuse d/8° reflectance, d/8° total transmission, d/0° regular transmission
Spectrophotometer: Two 256 element diode arrays with a high resolution, concave holographic grating
Sphere Diameter: 152 mm (6 in.)
Sphere Coating: Spectraflect™ for sphere, Duraflect™ for port plate and specular exclusion door
Port Size/Measured Area:
Lens Switching for LAV/SAV: Automatic
Specular Component: Automated Included (RSIN) or Excluded (RSEX) in reflectance
Spectral Range: 360 nm - 780 nm full CIE visible range
Wavelength Resolution: < 2 nm
Effective Bandwidth: 10 nm equivalent triangular
Reporting Interval: 10 nm
Photometric Range: 0 to 150 %
Photometric Resolution: 0.003 % (0.01 % reported)
Light Source: Pulsed Xenon lamp, filtered to approximate D65 daylight
Automatic UV Control:
Flashes per Measurement: 1 in LAV mode (4 in. SAV mode)
Measurement Time: < 5 seconds
Transmission Modes: Total (TTRAN) and Regular (RTRAN)
Transmission Compartment: Large and open on 3 sides, 10.2 cm D X 35.6 cm W x 16.5 cm H (4 in. D x 14 in. W x 6.5 in. H)
Standards Conformance
Standards Traceability: Instrument standard assignment in accordance with National Institute of Standards and Technology (NIST) following practices described in CIE Publication 44 and ASTM E259